rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Quantum metrology with photoelectrons
    part number: Volume 2
    part name: Applications and advances
  name:
    name part: Hockett, Paul
    role:
      role term: creator
    role:
      role term: συγγραφέας.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: cau
    place:
      place term: San Rafael [Καλιφόρνια]
    publisher: Morgan & Claypool Publishers
    date issued: c2018
    date issued: 2018
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: access
    form: remote
    extent: 1 ηλεκτρονική πηγή (ποικίλες σελιδαριθμήσεις) : έγχρ. εικ..
  abstract: Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
  table of contents: part III. Developments, methodologies and measurements -- 8. Developing quantum metrology with photoelectrons -- 8.1. Historical development : complete photoionization experiments -- 8.2. Experimental and analysis methodologies
  table of contents: 9. State-resolved frequency-domain measurements -- 9.1. Rotationally-resolved photoelectron imaging -- 9.2. Bootstrapping complexity : from atomic to molecular scattering -- 9.3. Photoelectron angular interferograms and determination of the dipole matrix elements -- 9.4. Uniqueness : mapping the [chi]2 hyperspace and verification -- 9.5. Pump-probe polarization geometry dependence and tomographic imaging
  table of contents: 10. Time-domain measurements with intra-pulse dynamics -- 10.1. Photoelectron imaging measurements from potassium -- 10.2. Photoelectron image simulation and parameter reconstruction -- 10.3. Photoelectron angular interferograms and determination of the dipole matrix elements -- 10.4. Mapping [chi]2 : fit statistics and sensitivity -- 10.5. Comparison with tomographic data
  table of contents: 11. Time-domain measurements with rotational wavepackets : bootstrapping protocol -- 11.1. Test case : butadiene model -- 11.2. Nitrogen aligned-frame photoelectron imaging -- 11.3. Bootstrapping protocol -- 11.4. Photoionization matrix elements -- 11.5. Molecular frame reconstructions -- 11.6. Bootstrap protocol summary and outlook
  table of contents: part IV. Generalisations and future directions -- 12. Advances -- 12.1. Information content revisited -- 12.2. Multiplexing and control -- 12.3. Generalised bootstrapping
  table of contents: 13. Future directions and outlook -- 13.1. Bootstrapping to quantitative quantum dynamics -- 13.2. Further directions for quantum metrologies based on photoelectron interferograms -- 13.3. Summary and outlook.
  note: Paul Hockett.
  note: Περιλαμβάνει βιβλιογραφικές παραπομπές.
  subject:
    topic: Μετρολογία
  subject:
    topic: Θεωρία κβαντικής μέτρησης
  classification: 389.1
  related item:
    title info:
      title: IOP concise physics
  identifier: 9781681746883
  identifier: 9781681746906
  identifier: 9781681746890
  identifier: http://iopscience.iop.org/book/978-1-6817-4688-3
  record info:
    record content source: CaBNVSL
    record creation date: 180504
    record change date: 20190304183941.0
    record identifier: 9781681746883
    language of cataloging:
      language term: gre