rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Applied logistic regression
  name:
    name part: Hosmer, David W.
    role:
      role term: creator
  name:
    name part: Lemeshow, Stanley
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: nyu
    place:
      place term: New York
    publisher: John Wiley
    date issued: [c2000]
    date issued: 2000
    edition: 2nd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xii., 373 σ. : εικ. ; 25 εκ.
  note: David W. Hosmer, Stanley Lemeshow.
  note: "A Wiley-Interscience publication."
  note: Περιλαμβάνει βιβλιογραφικές παραπομπές και ευρετήριο.
  subject:
    topic: Regression analysis
  subject:
    topic: Ανάλυση παλινδρόμησης
  subject:
    topic: ΟΙΚΟΝΟΜΕΤΡΙΚΑ ΜΟΝΤΕΛΑ
  classification: 330.015 195
  related item:
    title info:
      title: Wiley series in probability and statistics. Texts and references section
  identifier: 0471356328
  identifier: 9780471356325
  record info:
    record content source: GrPaTEI
    record creation date: 080226
    record identifier: GR-MES15120
    language of cataloging:
      language term: gre
    language of cataloging:
      language term: gre