rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: System-on-chip test architectures
    sub title: nanometer design for testability
  name:
    name part: Wang, Laung-Terng.
    role:
      role term: επιμελητής.
  name:
    name part: Stroud, Charles E.
    role:
      role term: επιμελητής.
  name:
    name part: Touba, Nur A.
    role:
      role term: επιμελητής.
  type of resource: text
  genre: bibliography
  origin info:
    place:
      place term: ne
    place:
      place term: Amsterdam
    place:
      place term: Boston
    publisher: Morgan Kaufmann Publishers
    date issued: c2008
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xxxvi, 856 σ. : εικ. ; 25 εκ.
  note: edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
  note: Περιλαμβάνει βιβλιογραφικές παραπομπές και ευρετήριο.
  subject:
    topic: Ολοκληρωμένα κυκλώματα
    topic: Ολοκλήρωση πολύ μεγάλης κλίμακας
  classification: 621.395
  related item:
    title info:
      title: The Morgan Kaufmann series in systems on silicon
  identifier: 9780123739735 (σκληρό εξώφυλλο)
  identifier: 2007023373
  record info:
    record content source: DLC
    record creation date: 070604
    record change date: 20210705133404.0
    record identifier: 14878050
    language of cataloging:
      language term: gre