rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advanced Test Methods for SRAMs
    sub title: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
  name:
    name part: Bosio, Alberto
    role:
      role term: creator
  name:
    name part: Dilillo, Luigi
  name:
    name part: Girard, Patrick
  name:
    name part: Pravossoudovitch, Serge
  name:
    name part: Virazel, Arnaud
  name:
    name part: SpringerLink (Online service)
  origin info:
    place:
      place term: Boston, MA
    publisher: Springer-Verlag US
    date issued: 2010
    edition: 1
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic resource
    extent: v.: digital
  note: by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
  subject:
    topic: Engineering
  subject:
    topic: Computer aided design
  subject:
    topic: Systems engineering
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Computer-Aided Engineering (CAD, CAE) and Design
  identifier: 9781441909381
  identifier: http://dx.doi.org/10.1007/978-1-4419-0938-1
  location:
    physical location: GR-PaULI ΠΑΤΡΑ ΒΚΠ
  record info:
    record content source: GR-PaULI
    record creation date: 110802
    record change date: 20210117202813.0
    record identifier: 10090323