http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
by Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
Computer-Aided Engineering (CAD, CAE) and Design