rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Defect Oriented Testing for CMOS Analog and Digital Circuits
  name:
    name part: Sachdev, Manoj
    role:
      role term: aut
  type of resource: text
  origin info:
    place:
      place term: Boston
    publisher: Kluwer Academic Publishers
    date issued: c1998
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: print
    extent: xiv,308p. fig.
  note: includes bibl. references
  subject:
    topic: Αναλογικά ολοκληρωμένα κυκλώματα
  subject:
    topic: CIRCUIT DESIGN
  subject:
    topic: CMOS
  subject:
    topic: DIGITAL CIRCUITS
  subject:
    topic: ΕΠΕΑΕΚ
  related item:
    title info:
      title: Frontiers in Electronic Testing / Vishwani D. Agrawal
  related item:
    name:
      name part: Frontiers in Electronic Testing
  identifier: 0 7923 8083 5
  location:
    physical location: GR-PaULI ΠΑΤΡΑ ΤΜΗΥΠ
  record info:
    record content source: Βιβλιοθήκη ΕΑΙΤΥ
    record creation date: 991022
    record change date: 20210526153013.0
    record identifier: 10105287