rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Design for AT-Speed Test, Diagnosis and Measurement
  name:
    name part: Nadeau-Dostie, Benoit.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2000
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XVII, 239 p. online resource.
  abstract: Design for AT-Speed Test, Diagnosis and Measurement is the first book to offer practical and proven design-for-testability (DFT) solutions to chip and system design engineers, test engineers and product managers at the silicon level as well as at the board and systems levels. Designers will see how the implementation of embedded test enables simplification of silicon debug and system bring-up. Test engineers will determine how embedded test provides a superior level of at-speed test, diagnosis and measurement without exceeding the capabilities of their equipment. Product managers will learn how the time, resources and costs associated with test development, manufacture cost and lifecycle maintenance of their products can be significantly reduced by designing embedded test in the product. A complete design flow and analysis of the impact of embedded test on a design makes this book a `must read' before any DFT is attempted.
  table of contents: Technology Overview -- Memory Test and Diagnosis -- Logic Test and Diagnosis -- Embedded Test Design Flow -- Hierarchical Core Test -- Test and Measurement for PLLs and ADCs -- System Test and Diagnosis -- System Reuse of Embedded Test.
  note: edited by Benoit Nadeau-Dostie.
  subject:
    topic: Engineering
  subject:
    topic: Electrical engineering
  subject:
    topic: Electronic circuits
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Electrical Engineering
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Frontiers in Electronic Testing, 15
  identifier: 9780306475443
  identifier: http://dx.doi.org/10.1007/b117472
  record info:
    record creation date: 100301
    record change date: 20151204152724.0
    record identifier: 978-0-306-47544-3