rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Dynamic Characterisation of Analogue-to-Digital Converters
  name:
    name part: Dallet, Dominique.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Silva, José Machado da.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2005
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XX, 280 p. online resource.
  abstract: The Analogue-to-digital converter (ADC) is the most pervasive block in electronic systems. With the advent of powerful digital signal processing and digital communication techniques, ADCs are fast becoming critical components for system’s performance and flexibility. Knowing accurately all the parameters that characterise their dynamic behaviour is crucial, on one hand to select the most adequate ADC architecture and characteristics for each end application, and on the other hand, to understand how they affect performance bottlenecks in the signal processing chain. Dynamic Characterisation of Analogue-to-Digital Converters presents a state of the art overview of the methods and procedures employed for characterising ADCs’ dynamic performance behaviour using sinusoidal stimuli. The three classical methods – histogram, sine wave fitting, and spectral analysis – are thoroughly described, and new approaches are proposed to circumvent some of their limitations. This is a must-have compendium, which can be used by both academics and test professionals to understand the fundamental mathematics underlining the algorithms of ADC testing, and as an handbook to help the engineer in the most important and critical details for their implementation.
  table of contents: ADC Characterisation Based on Sinewave Analysis -- ADC Applications, Architectures and Terminology -- Sinewave Test Setup -- Time-Domain Data Analysis -- Frequency-Domain Data Analysis -- Code Histogram Test -- Comparative Study of ADC Sinewave Test Methods -- Measurement of Additional Parameters -- Jitter Measurement -- Differential Gain and Phase Testing -- Step and Transient Response Measurement -- Hysteresis Measurement.
  note: by Dominique Dallet, José Machado da Silva.
  subject:
    topic: Engineering
  subject:
    topic: Physical measurements
  subject:
    topic: Measurement
  subject:
    topic: Engineering design
  subject:
    topic: Electrical engineering
  subject:
    topic: Microwaves
  subject:
    topic: Optical engineering
  subject:
    topic: Electronics
  subject:
    topic: Microelectronics
  subject:
    topic: Electronic circuits
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Electrical Engineering
  subject:
    topic: Engineering Design
  subject:
    topic: Electronics and Microelectronics, Instrumentation
  subject:
    topic: Microwaves, RF and Optical Engineering
  subject:
    topic: Measurement Science and Instrumentation
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: The International Series in Engineering and Computer Science, Analog Circuits and Signal Processing, 860
  identifier: 9780387259031
  identifier: http://dx.doi.org/10.1007/b136458
  record info:
    record creation date: 100301
    record change date: 20151204172353.0
    record identifier: 978-0-387-25903-1