rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    non sort: The
    title: Core Test Wrapper Handbook
    sub title: Rationale and Application of IEEE Std. 1500™
  name:
    name part: Silva, Francisco da.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: McLaurin, Teresa.
    role:
      role term: author.
  name:
    name part: Waayers, Tom.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2006
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXIX, 276 p. online resource.
  abstract: The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM provides insight into the rules and recommendations of IEEE Std. 1500. The authors present background information about some of the choices and decisions made throughout the design of this IEEE standard conceived to enable efficient core test reuse and debug at the SOC level. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM focuses on practical design considerations and design choices inherent to the application of IEEE Std. 1500. This book teaches an engineer how to add a 1500 wrapper to their core in easy to understand steps. Starting with a bare core (a core without 1500 wrapper), the book progressively builds a 1500 compliant wrapper around this core while discussing overall requirements for each portion of the 1500 wrapper. The Core Test Wrapper Handbook: Rationale and Application of IEEE Std. 1500TM is a very valuable reference for professionals and researchers in the areas of design for test, design for test reuse/design reuse, and SOC implementation.
  table of contents: What is the IEEE 1500 Standard? -- Why use the IEEE 1500 Standard? -- Illustration Example -- Design of the IEEE 1500 Interface Port -- Instruction Types -- Design of the WBR -- Design of the WBY -- Design of the WIR -- Hierarchical Cores -- Finalizing the Wrapper Solution for the EX Core -- SOC Integration of 1500 Compliant Cores.
  note: by Francisco da Silva, Teresa McLaurin, Tom Waayers.
  subject:
    topic: Engineering
  subject:
    topic: Computer-aided engineering
  subject:
    topic: Electrical engineering
  subject:
    topic: Electronics
  subject:
    topic: Microelectronics
  subject:
    topic: Electronic circuits
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Computer-Aided Engineering (CAD, CAE) and Design
  subject:
    topic: Electronics and Microelectronics, Instrumentation
  subject:
    topic: Electrical Engineering
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Frontiers in Electronic Testing, 35
  identifier: 9780387346090
  identifier: http://dx.doi.org/10.1007/0-387-34609-0
  record info:
    record creation date: 100301
    record change date: 20151204143539.0
    record identifier: 978-0-387-34609-0