rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Metric- Driven Design Verification
    sub title: An Engineer's and Executive's Guide to First Pass Success
  name:
    name part: Carter, Hamilton B.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Hemmady, Shankar.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2007
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXVII, 361 p. 178 illus. online resource.
  abstract: Exponentially increasing design complexity has necessitated the adoption of metric driven planning and project management. Metric Driven Design Verification provides the semiconductor industry’s first metric driven based approach to functional verification. A metric based flow is described that focuses on the four steps of: 1. Planning: Defining what needs to be done and the automatically trackable metrics that will be used to measure progress. 2. Execution: Implementing verification environments and then extensively exercising the device under verification utilizing comprehensive, massively parallel regression strategies. 3. Measurement: Automatically capturing the metrics defined in planning to provide objective data with which to manage the verification project. Custom tailoring those metrics through an automated reporting framework to provide all stakeholders a real-time meaningful view of project status. 4. Response: Utilizing the returned metrics to effectively adapt to changing project conditions. Making use of automated response mechanisms to automate engineering processed and management response to streamline project management processes. The primary audience for this book is professional engineers, managers, and executives. It is written in an easily understandable style and consists of four parts. The first three parts are tailored for executives, engineering managers, and engineers respectively. The fourth part presents case studies and commentaries from industry luminaries and experts on metric driven verification. Metric Driven Design Verification brings together the best practices and real-life experiences of several leading electronic companies worldwide in planning and managing verification projects, while automating critical processes. It addresses all aspects of verification and summarizes the different options available to engineers, managers and executives.
  table of contents: Analyzing And Driving Verification: An Executive's Guide -- The Verification Crisis -- Automated Metric-Driven Processes -- Roles in a Verification Project -- Overview of a Verification Project -- Verification Technologies -- Managing The Verification Process -- Verification Planning -- Capturing Metrics -- Regression Management -- Revision Control and Change Integration -- Debug -- Executing The Verification Process -- Coverage Metrics -- Modeling and Architectural Verification -- Assertion-Based Verification -- Dynamic Simulation-Based Verification -- System Verification -- Mixed Analog and Digital Verification -- Design for Test -- Case Studies And Commentaries -- Metric-Driven Design Verification: Why Is My Customer a Better Verification Engineer Than Me? -- Metric-Driven Methodology Speeds the Verification of a Complex Network Processor -- Developing a Coverage-Driven SoC Methodology -- From Panic-Driven to Plan-Driven Verification Managing the Transition -- Verification of a Next-Generation Single-Chip Analog TV and Digital TV ASIC -- Management IP: New Frontier Providing Value Enterprise-Wide -- Adelante VD3204x Core, SubSystem, and SoC Verification -- SystemC-based Virtual SoC: An Integrated System-Level and Block-Level Verification Approach from Simulation to Coemulation -- Is Your System-Level Project Benefiting from Collaboration or Headed to Chaos?.
  note: by Hamilton B. Carter, Shankar Hemmady.
  subject:
    topic: Engineering
  subject:
    topic: Electrical engineering
  subject:
    topic: Electronics
  subject:
    topic: Microelectronics
  subject:
    topic: Electronic circuits
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Electrical Engineering
  subject:
    topic: Electronics and Microelectronics, Instrumentation
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  identifier: 9780387381527
  identifier: http://dx.doi.org/10.1007/978-0-387-38152-7
  record info:
    record creation date: 100301
    record change date: 20151204174709.0
    record identifier: 978-0-387-38152-7