rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
  name:
    name part: Echlin, Patrick.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2009
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XII, 332 p. 159 illus. in color. online resource.
  abstract: This Handbook is a complete guide to preparing a wide variety of specimens for the scanning electron microscope and x-ray microanalyzers. Specimens range from inorganic, organic, biological, and geological samples to materials such as metals, polymers, and semiconductors which can exist as solids, liquids and gases. While the Handbook complements the best-selling textbook, Scanning Electron Microscopy and X-Ray Microanalysis, Third Edition, by Goldstein, et al., it is entirely self-contained and describes what is needed up to the point the sample is put into the instrument. Photomicrographs of each specimen complement the many sample preparation "recipes." Additional chapters describe the general features of specimen preparation in relation to the different needs of scanning electron microscopes and x-ray microanalyzers, and an appendix covers chemicals and equipment applicable to any of the recipes. This practical Handbook is an essential reference for anyone who uses these instruments. It assumes only an elementary knowledge of preparation techniques but also serves as an authoritative guide for more experienced microscopists.
  table of contents: Sample Collection and Selection -- Sample Preparation Tools -- Sample Support -- Sample Embedding ?and Mounting -- Sample Exposure -- Sample Dehydration -- Sample Stabilization for Imaging in the SEM -- Sample Stabilization to Preserve Chemical Identity -- Sample Cleaning -- Sample Surface Charge Elimination -- Sample Artifacts and Damage -- Additional Sources of Information.
  note: by Patrick Echlin.
  subject:
    topic: Materials science
  subject:
    topic: Microscopy
  subject:
    topic: Condensed matter
  subject:
    topic: Biophysics
  subject:
    topic: Biological physics
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Biological Microscopy
  subject:
    topic: Condensed Matter Physics
  subject:
    topic: Biophysics and Biological Physics
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9780387857312
  identifier: http://dx.doi.org/10.1007/978-0-387-85731-2
  record info:
    record creation date: 110414
    record change date: 20151204173126.0
    record identifier: 978-0-387-85731-2