rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials
    sub title: Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
  name:
    name part: Vilarinho, Paula Maria.
    role:
      role term: editor.
  name:
    name part: Rosenwaks, Yossi.
    role:
      role term: editor.
  name:
    name part: Kingon, Angus.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: ne
    date issued: 2005
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXXVII, 488 p. online resource.
  abstract: As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in nanoscience and nanotechnology. SPM is opening new opportunities to measure semiconductor electronic properties with unprecedented spatial resolution. SPM is being successfully applied for nanoscale characterization of ferroelectric thin films. In the area of functional molecular materials it is being used as a probe to contact molecular structures in order to characterize their electrical properties, as a manipulator to assemble nanoparticles and nanotubes into simple devices, and as a tool to pattern molecular nanostructures. This book provides in-depth information on new and emerging applications of SPM to the field of materials science, namely in the areas of characterisation, device application and nanofabrication of functional materials. Starting with the general properties of functional materials the authors present an updated overview of the fundamentals of Scanning Probe Techniques and the application of SPM techniques to the characterization of specified functional materials such as piezoelectric and ferroelectric and to the fabrication of some nano electronic devices. Its uniqueness is in the combination of the fundamental nanoscale research with the progress in fabrication of realistic nanodevices. By bringing together the contribution of leading researchers from the materials science and SPM communities, relevant information is conveyed that allows researchers to learn more about the actual developments in SPM applied to functional materials. This book will contribute to the continuous education and development in the field of nanotechnology.
  table of contents: Fundamentals of Functional Materials -- Functional Materials: Properties, Processing and Applications -- Scaling of Silicon-Based Devices to Submicron Dimensions -- Unsolved Problems in Ferroelectrics for Scanning Probe Microscopy -- Fundamentals of Scanning Probe Techniques -- Principles of Basic and Advanced Scanning Probe Microscopy -- Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopy -- Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopy -- Expanding the Capabilities of the Scanning Tunneling Microscope -- Functions of NC-AFM on Atomic Scale -- Application of Scanning Techniques to Functional Materials -- Scanning Probe Microscopy of Piezoelectric and Transport Phenomena in Electroceramic Materials -- SFM-Based Methods for Ferroelectric Studies -- Scanning Tunneling Spectroscopy -- Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functional Ferroelectric PZT Thin Films -- Microscale Contact Charging on a Silicon Oxide -- Constructive Nanolithography -- Nanometer-Scale Electronics and Storage -- Contributed papers -- Stm Tips Fabrication for Critical Dimension Measurements -- Scanning Probe Microscopy Characterization of Ferroelectrics Domains and Domains Walls in KTiOPO4 -- Imaging Local Dielectric and Mechanical Responses with Dynamic Heterodyned Electrostatic Force Microscopy -- AFM Patterning of SrTiO3?? Thin Films and Device Applications -- Nanoscale Investigation of a Rayleigh Wave on LiNbO3 -- Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2 -- Electrical Characterisation of III–V Buried Heterostructure Lasers by Scanning Capacitance Microscopy -- Probing the Density of States of High Temperature Superconductors with Point Contact Tunneling Spectroscopy -- Annealing Influence on Co Ultrathin Film Morphology in MBE Grown Co/Au Bilayers -- Correlation between the Surface Relief and In…
  note: edited by Paula Maria Vilarinho, Yossi Rosenwaks, Angus Kingon.
  subject:
    topic: Physics
  subject:
    topic: Condensed matter
  subject:
    topic: Optical materials
  subject:
    topic: Electronic materials
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Physics
  subject:
    topic: Condensed Matter Physics
  subject:
    topic: Optical and Electronic Materials
  subject:
    topic: Nanotechnology
  subject:
    topic: Surfaces and Interfaces, Thin Films
  classification: QC173.45-173.458
  classification: 530.41
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: NATO Science Series II: Mathematics, Physics and Chemistry, 186
  identifier: 9781402030192
  identifier: http://dx.doi.org/10.1007/1-4020-3019-3
  record info:
    record creation date: 100301
    record change date: 20151204184640.0
    record identifier: 978-1-4020-3019-2