rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Radiation Effects on Embedded Systems
  name:
    name part: VELAZCO, RAOUL.
    role:
      role term: editor.
  name:
    name part: FOUILLAT, PASCAL.
    role:
      role term: editor.
  name:
    name part: REIS, RICARDO.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: ne
    date issued: 2007
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: VIII, 269 p. online resource.
  abstract: Radiation Effects on Embedded Systems aims at providing the reader with the major guidelines for coping with radiation effects on components supposed to be included in today’s applications devoted to operate in space, but also in the atmosphere at high altitude or at ground level. It contains a set of chapters based on the tutorials presented at the International School on Effects of Radiation on Embedded Systems for Space Applications (SERESSA) that was held in Manaus, Brazil, from 20 to 25 November 2005. This book will provide all IC engineers with useful information regarding outside (environmental) influences on their designs and is an excellent reference.
  table of contents: Radiation Space Environment -- Radiation Effects in Microelectronics -- In-flight Anomalies on Electronic Devices -- Multi-level Fault Effects Evaluation -- Effects of Radiation on Analog and Mixed-Signal Circuits -- Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing -- Design Hardening Methodologies for ASICs -- Fault Tolerance in Programmable Circuits -- Automatic Tools for Design Hardening -- Test Facilities for SEE and Dose Testing -- Error Rate Prediction of Digital Architectures: Test Methodology and Tools -- Using the SEEM Software for Laser SET Testing and Analysis.
  note: edited by RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS.
  subject:
    topic: Engineering
  subject:
    topic: Nuclear energy
  subject:
    topic: Electrical engineering
  subject:
    topic: Electronics
  subject:
    topic: Microelectronics
  subject:
    topic: Electronic circuits
  subject:
    topic: Nuclear engineering
  subject:
    topic: Radiation protection
  subject:
    topic: Radiation
    topic: Safety measures
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Effects of Radiation/Radiation Protection
  subject:
    topic: Electrical Engineering
  subject:
    topic: Electronics and Microelectronics, Instrumentation
  subject:
    topic: Nuclear Engineering
  subject:
    topic: Nuclear Energy
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  identifier: 9781402056468
  identifier: http://dx.doi.org/10.1007/978-1-4020-5646-8
  record info:
    record creation date: 100301
    record change date: 20151204175506.0
    record identifier: 978-1-4020-5646-8