rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Process Variations and Probabilistic Integrated Circuit Design
  name:
    name part: Dietrich, Manfred.
    role:
      role term: editor.
  name:
    name part: Haase, Joachim.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2012
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XVI, 252 p. online resource.
  abstract: Uncertainty in key parameters within a chip and between different chips in the deep sub micron era plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design. Trains IC designers to recognize problems caused by parameter variations during manufacturing and to choose the best methods available to mitigate these issues during the design process; Offers both qualitative and quantitative insight into critical effects of process variation from perspectives of manufacturing, electronic design automation and circuit design; Describes critical effects of process variation using simple examples that can be reproduced by the reader. .
  table of contents: Introduction -- Physical and Mathematical Fundamentals -- Examination of Process Parameter Variations -- Methods of Parameter Variations -- Consequences for Circuits Design and Case Studies -- Conclusion.
  note: edited by Manfred Dietrich, Joachim Haase.
  subject:
    topic: Engineering
  subject:
    topic: Computer-aided engineering
  subject:
    topic: Electronic circuits
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Computer-Aided Engineering (CAD, CAE) and Design
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  identifier: 9781441966216
  identifier: http://dx.doi.org/10.1007/978-1-4419-6621-6
  record info:
    record creation date: 111119
    record change date: 20151204190231.0
    record identifier: 978-1-4419-6621-6