rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Scanning Transmission Electron Microscopy
    sub title: Imaging and Analysis
  name:
    name part: Pennycook, Stephen J.
    role:
      role term: editor.
  name:
    name part: Nellist, Peter D.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2011
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XII, 762 p. online resource.
  abstract: Scanning transmission electron microscopy has become a mainstream technique for imaging and analysis at atomic resolution and sensitivity, and the editors of this book are widely credited with bringing the field to its present popularity. Scanning Transmission Electron Microscopy: Imaging and Analysis provides a comprehensive explanation of the theory and practice of STEM from introductory to advanced levels, covering the history of the field, the instrument, image formation and scattering theory, as well as practical aspects of imaging and analysis. The authors present examples of the use of combined imaging and spectroscopy for solving materials problems in a variety of fields, including condensed matter physics, materials science, catalysis, and nanoscience. Therefore this is a comprehensive reference for those working in applied fields wishing to use the technique, for graduate students learning microscopy for the first time, and for specialists in other fields of microscopy.
  table of contents: Electron Optics and Aberration Correction -- Fundamentals of Scattering Theory -- Image formation in STEM -- Electron energy loss spectroscopy -- Energy dispersive x-ray analysis -- STEM of complex oxides -- STEM of complex alloys -- STEM of catalysts -- STEM of semiconductor devices -- STEM of ceramic materials -- STEM of quasicrystals -- STEM of nanomaterials -- 3D STEM: tomography -- 3D STEM: depth slicing -- Nanobeam diffraction.
  note: edited by Stephen J. Pennycook, Peter D. Nellist.
  subject:
    topic: Materials science
  subject:
    topic: Microscopy
  subject:
    topic: Condensed matter
  subject:
    topic: Solid state physics
  subject:
    topic: Optical materials
  subject:
    topic: Electronic materials
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials Science
  subject:
    topic: Optical and Electronic Materials
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Biological Microscopy
  subject:
    topic: Solid State Physics
  subject:
    topic: Condensed Matter Physics
  subject:
    topic: Nanotechnology
  classification: TA1750-1750.22
  classification: 620.11295
  classification: 620.11297
  related item:
    title info:
      title: Springer eBooks
  identifier: 9781441972002
  identifier: http://dx.doi.org/10.1007/978-1-4419-7200-2
  record info:
    record creation date: 110324
    record change date: 20151125193822.0
    record identifier: 978-1-4419-7200-2