rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: MEMS and Nanotechnology, Volume 6
    sub title: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics
  name:
    name part: Shaw, Gordon A.
    role:
      role term: editor.
  name:
    name part: Prorok, Barton C.
    role:
      role term: editor.
  name:
    name part: Starman, LaVern A.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2013
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: VIII, 156 p. online resource.
  abstract: MEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: Devices & Fabrication Measurement Challenges in Single Molecule/Single Atom Mechanical Testing Nanoindentation Size Effects in Metals Optical Methods Reliability, Residual Stress & Tribology.
  table of contents: From the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor -- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches -- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules -- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration -- A Precision Force Microscope for Biophysics -- DNA Molecular Recognition Using AFM Nanometrology -- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy -- New Insight into Pile-Up in Thin Film Indentation.
  note: edited by Gordon A. Shaw, Barton C. Prorok, LaVern A. Starman.
  subject:
    topic: Engineering
  subject:
    topic: Mechanics
  subject:
    topic: Mechanics, Applied
  subject:
    topic: Nanotechnology
  subject:
    topic: Engineering
  subject:
    topic: Nanotechnology and Microengineering
  subject:
    topic: Theoretical and Applied Mechanics
  subject:
    topic: Nanotechnology
  classification: T174.7
  classification: 620.5
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Conference Proceedings of the Society for Experimental Mechanics Series
  identifier: 9781461444367
  identifier: http://dx.doi.org/10.1007/978-1-4614-4436-7
  record info:
    record creation date: 120905
    record change date: 20151125231749.0
    record identifier: 978-1-4614-4436-7