rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Practical Materials Characterization
  name:
    name part: Sardela, Mauro.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2014
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: VII, 237 p. 118 illus., 92 illus. in color. online resource.
  abstract: This unique book covers the most common materials analysis techniques, such as transmission electron microscopy, x-ray diffraction and reflectivity, auger electron spectroscopy, secondary ion mass spectrometry, photoelectron spectroscopy, and several optical characterization methods. It stands as a quick reference for experienced users, as a learning tool for students, and as a guide for the understanding of typical data interpretation for anyone looking at results from a range of analytical techniques. The book includes analytical methods covering microstructural, surface, morphological, and optical characterization of materials with emphasis on microscopic structural, electronic, biological, and mechanical properties. Many examples in this volume cover cutting-edge technologies such as nanomaterials and life sciences. This book also: · Presents cross-comparison between materials characterization techniques, including x-ray diffraction and reflectivity, x-ray photoelectron spectroscopy, secondary ion mass spectrometery, ellipsometry, Raman spectroscopy, and more · Includes clear specifications of strengths and limitations of each technique for specific materials characterization problem · Focuses on applications and clear data interpretation without extensive mathematics.
  table of contents: 1. X-Ray Diffraction and Reflectivity -- 2. Introduction to Optical Characterization of Materials -- 3. X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES) -- 4. Secondary Ion Mass Spectrometry -- 5. Transmission Electron Microscopy.
  note: edited by Mauro Sardela.
  subject:
    topic: Materials science
  subject:
    topic: Mass spectrometry
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Mass Spectrometry
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9781461492818
  identifier: http://dx.doi.org/10.1007/978-1-4614-9281-8
  record info:
    record creation date: 140710
    record change date: 20151204145857.0
    record identifier: 978-1-4614-9281-8