rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Advanced Transmission Electron Microscopy
    sub title: Imaging and Diffraction in Nanoscience
  name:
    name part: Zuo, Jian Min.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Spence, John C.H.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxu
    date issued: 2017
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXVI, 729 p. 310 illus., 218 illus. in color. online resource.
  abstract: This volume expands and updates the coverage in the authors' classic 1992 book, "Electron Microdiffraction." As the title implies, the focus of the book has changed from electron microdiffraction, or convergent beam electron diffraction, to electron nanodiffraction and the applications of electron diffraction from single crystals as well as general structure analysis of single crystals, powders, and nanostructures. Advanced Transmission Electron Microscopy provides a comprehensive treatment of theory and practice, and is written at a level suitable for advanced undergraduate students and graduate students and researchers in materials science, chemistry, and physics. Practical guides are provided for interpretation and simulation of electron diffraction patterns.
  table of contents: Introduction and historical background -- Electron Waves and Wave Propagation -- The geometry of electron diffraction patterns -- Kinematical Theory of Electron Diffraction -- Dynamical Theory of Electron Diffraction for Perfect Crystals -- Electron optics -- Lens aberrations and Aberration Correction -- Electron Sources -- Electron Detectors -- Instrumentation and experimental techniques -- Crystal symmetry -- Crystal structure and bonding -- Diffuse Scattering -- Atomic resolution electron imaging -- Imaging and characterization of crystal defects -- Strain Measurements and Mapping -- Structure of Nanocrystals, Nanoparticles and Nanotubes.
  note: by Jian Min Zuo, John C.H. Spence.
  subject:
    topic: Materials science
  subject:
    topic: Nanochemistry
  subject:
    topic: Solid state physics
  subject:
    topic: Nanoscale science
  subject:
    topic: Nanoscience
  subject:
    topic: Nanostructures
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Optics, Lasers, Photonics, Optical Devices
  subject:
    topic: Nanochemistry
  subject:
    topic: Nanoscale Science and Technology
  subject:
    topic: Nanotechnology
  subject:
    topic: Solid State Physics
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9781493966073
  identifier: http://dx.doi.org/10.1007/978-1-4939-6607-3
  record info:
    record creation date: 161026
    record change date: 20161026064725.0
    record identifier: 978-1-4939-6607-3