rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Computational Surface and Roundness Metrology
  name:
    name part: Muralikrishnan, Bala.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Raja, Jay.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: xxk
    date issued: 2009
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XX, 263 p. 87 illus. online resource.
  abstract: Computational Surface and Roundness Metrology provides an extraordinarily practical and hands-on approach towards understanding the diverse array of mathematical methods used in surface texture and roundness analysis. The book, in combination with a mathematical package or programming language interface, provides an invaluable tool for experimenting, learning, and discovering the many flavors of mathematics that are so routinely taken for granted in metrology. Whether the objective is to understand the origin of that ubiquitous transmission characteristics curve of a filter we see so often yet do not quite comprehend, or to delve into the intricate depths of a deceptively simple problem of fitting a line or a plane to a set of points, Computational Surface and Roundness Metrology describes it all (in exhaustive detail) using examples, illustrations, exercises, and a link to some of the finest publications in the field for over half a century. From the graduate student of metrology to the practicing engineer on the shop floor, Computational Surface and Roundness Metrology is a must-have reference for all involved in metrology, instrumentation/optics, manufacturing, and electronics.
  table of contents: Filtering -- A Brief History of Filtering -- Filtering in the Frequency Domain -- Filtering in the Time Domain -- Gaussian Filter -- The 2RC Filter -- Filtering Roundness Profiles -- Filtering 3D Surfaces -- Advanced Filtering -- Gaussian Regression Filters -- Spline Filter -- Robust Filters -- Envelope and Morphological Filters -- Multi-scale Filtering -- Fitting -- to Fitting Substitute Geometry -- Least-Squares Best-Fit Line and Plane -- Non-linear Least-Squares I: Introduction -- Non-linear Least-Squares II: Circle, Sphere, and Cylinder -- Fitting Radius-Suppressed Circle Data -- Exchange Algorithms for Minimum Zone -- Reference Circle-Fitting Using Linear Programming Simplex -- Parameterization -- Surface Finish Parameters I: Amplitude, Spacing, Hybrid, and Shape -- Surface Finish Parameters II: Autocorrelation, Power Spectral Density, Bearing Area -- 3D Surface Texture Parameters -- Errors and Uncertainty -- Uncertainty Considerations -- Uncertainty Propagation in Computations -- Error Separation Techniques in Roundness Metrology -- Other Relevant Topics.
  note: by Bala Muralikrishnan, Jay Raja.
  subject:
    topic: Engineering
  subject:
    topic: Computer-aided engineering
  subject:
    topic: Mathematical models
  subject:
    topic: Physical measurements
  subject:
    topic: Measurement
  subject:
    topic: Manufacturing industries
  subject:
    topic: Machines
  subject:
    topic: Tools
  subject:
    topic: Engineering
  subject:
    topic: Manufacturing, Machines, Tools
  subject:
    topic: Measurement Science and Instrumentation
  subject:
    topic: Mathematical Modeling and Industrial Mathematics
  subject:
    topic: Computer-Aided Engineering (CAD, CAE) and Design
  classification: TJ241
  classification: 670
  related item:
    title info:
      title: Springer eBooks
  identifier: 9781848002975
  identifier: http://dx.doi.org/10.1007/978-1-84800-297-5
  record info:
    record creation date: 100301
    record change date: 20151204175255.0
    record identifier: 978-1-84800-297-5