rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Debug Automation from Pre-Silicon to Post-Silicon
  name:
    name part: Dehbashi, Mehdi.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Fey, Görschwin.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2015
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XIV, 171 p. 93 illus., 55 illus. in color. online resource.
  abstract: This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers. Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages; Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level; Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
  table of contents: Introduction -- Preliminaries -- Part I Debug of Design Bugs -- Automated Debugging for Logic Bugs -- Automated Debugging from Pre-Silicon to Post-Silicon -- Automated Debugging for Synchronization Bugs -- Part II Debug of Delay Faults -- Analyzing Timing Variations -- Automated Debugging for Timing Variations -- Efficient Automated Speedpath Debugging -- Part III Debug of Transactions -- Online Debug for NoC-Based Multiprocessor SoCs -- Summary and Outlook.
  note: by Mehdi Dehbashi, Görschwin Fey.
  subject:
    topic: Engineering
  subject:
    topic: Microprocessors
  subject:
    topic: Electronic circuits
  subject:
    topic: Engineering
  subject:
    topic: Circuits and Systems
  subject:
    topic: Processor Architectures
  subject:
    topic: Electronic Circuits and Devices
  classification: TK7888.4
  classification: 621.3815
  related item:
    title info:
      title: Springer eBooks
  identifier: 9783319093093
  identifier: http://dx.doi.org/10.1007/978-3-319-09309-3
  record info:
    record creation date: 140925
    record change date: 20151204170743.0
    record identifier: 978-3-319-09309-3