rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Noncontact Atomic Force Microscopy
    sub title: Volume 3
  name:
    name part: Morita, Seizo.
    role:
      role term: editor.
  name:
    name part: Giessibl, Franz J.
    role:
      role term: editor.
  name:
    name part: Meyer, Ernst.
    role:
      role term: editor.
  name:
    name part: Wiesendanger, Roland.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2015
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXII, 527 p. 256 illus., 159 illus. in color. online resource.
  abstract: This book presents the latest developments in noncontact atomic force microscopy. It deals with the following outstanding functions and applications that have been obtained with atomic resolution after the publication of volume 2: (1) Pauli repulsive force imaging of molecular structure, (2) Applications of force spectroscopy and force mapping with atomic resolution, (3) Applications of tuning forks, (4) Applications of atomic/molecular manipulation, (5) Applications of magnetic exchange force microscopy, (6) Applications of atomic and molecular imaging in liquids, (7) Applications of combined AFM/STM with atomic resolution, and (8) New technologies in dynamic force microscopy. These results and technologies are now expanding the capacity of the NC-AFM with imaging functions on an atomic scale toward making them characterization and manipulation tools of individual atoms/molecules and nanostructures, with outstanding capability at the level of molecular, atomic, and subatomic resolution. Since the publication of vol. 2 of the book Noncontact Atomic Force Microscopy in 2009 the noncontact atomic force microscope, which can image even insulators with atomic resolution, has achieved remarkable progress. The NC-AFM is now becoming crucial for nanoscience and nanotechnology.
  table of contents: From the Contents: Introduction -- 3D Force-Field Spectroscopy -- Simultaneous NC-AFM/STM Measurements of Atomic-Sized Contacts -- Spectroscopy and Manipulation Using AFM/STM at Room Temperature -- The Phantom Force - The Influence of a Tunnel Current on Force Microscopy -- Non-Contact Friction -- Magnetic Exchange Force Spectroscopy.
  note: edited by Seizo Morita, Franz J. Giessibl, Ernst Meyer, Roland Wiesendanger.
  subject:
    topic: Physics
  subject:
    topic: Nanoscale science
  subject:
    topic: Nanoscience
  subject:
    topic: Nanostructures
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Physics
  subject:
    topic: Nanoscale Science and Technology
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Nanotechnology
  classification: QC176.8.N35
  classification: T174.7
  classification: 620.5
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: NanoScience and Technology
  identifier: 9783319155883
  identifier: http://dx.doi.org/10.1007/978-3-319-15588-3
  record info:
    record creation date: 150518
    record change date: 20151204185036.0
    record identifier: 978-3-319-15588-3