rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Physical Principles of Electron Microscopy
    sub title: An Introduction to TEM, SEM, and AEM
  name:
    name part: Egerton, R.F.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2016
    edition: 2nd ed. 2016.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XI, 196 p. 124 illus., 15 illus. in color. online resource.
  abstract: This popular textbook provides an introduction to the theory and practice of electron microscopy. The second edition has been updated to reflect the recent developments, including correction of lens aberrations in a TEM column and new material on environmental TEM and SEM. The text is linked to a new website that contains additional educational material such as sample exam questions and answers to selected problems. This edition also contains expanded reference lists that allow the reader to efficiently explore key topics in greater depth. Scanning and fixed-beam electron microscopes are an indispensable tool for both research and routine evaluation in the physical, biological and medical sciences, including specialized fields in materials science, nanotechnology and semiconductor processing. Physical Principles of Electron Microscopy, Second Edition, is ideal for students, researchers, and technologists who make use of electron microscopes but have only a limited knowledge of physics and mathematics. Undergraduate students will understand how basic principles of physics are utilized in this important area of applied science, while university teachers and researchers will find a concise but authoritative teaching, supplemental, or reference text covering the basic principles and practice of microscopy.
  table of contents: An Introduction to Microscopy -- Electron Optics -- The Transmission Electron Microscope -- TEM Specimens and Images -- The Scanning Electron Microscope -- Analytical Electron Microscopy -- Special Topics -- Appendix: Mathematical Derivations.
  note: by R.F. Egerton.
  subject:
    topic: Materials science
  subject:
    topic: Microscopy
  subject:
    topic: Spectroscopy
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Biological Microscopy
  subject:
    topic: Nanotechnology
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9783319398778
  identifier: http://dx.doi.org/10.1007/978-3-319-39877-8
  record info:
    record creation date: 160701
    record change date: 20160701154356.0
    record identifier: 978-3-319-39877-8