VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers - Shin, Youngsoo; Tsui, Chi Ying; Kim, Jae-Joon; Choi, Kiyoung; Reis, Ricardo (Springer International Publishing : Imprint: Springer, 2016)