rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Industrial X-Ray Computed Tomography
  name:
    name part: Carmignato, Simone.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: Dewulf, Wim.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: Leach, Richard.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2018
    edition: 1st ed. 2018.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: VII, 369 p. 273 illus. online resource.
  abstract: This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.
  table of contents: Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications.
  note: edited by Simone Carmignato, Wim Dewulf, Richard Leach.
  subject:
    topic: Materials science
  subject:
    topic: Manufactures
  subject:
    topic: Optical materials
  subject:
    topic: Electronic materials
  subject:
    topic: Atoms
  subject:
    topic: Physics
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Manufacturing, Machines, Tools, Processes
  subject:
    topic: Optical and Electronic Materials
  subject:
    topic: Atomic, Molecular, Optical and Plasma Physics
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9783319595733
  identifier: https://doi.org/10.1007/978-3-319-59573-3
  record info:
    record creation date: 171019
    record change date: 20191022151819.0
    record identifier: 978-3-319-59573-3