rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals
    sub title: A Scanning Probe Microscopy Approach
  name:
    name part: Kay, Nicholas D.
    role:
      role term: creator
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2018
    edition: 1st ed. 2018.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXI, 122 p. 67 illus., 14 illus. in color. online resource.
  abstract: This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers' understanding and visualization. The isolation of graphene and, shortly after, a host of other 2D materials has attracted a great deal of interest in the scientific community for both their range of extremely desirable and their record-breaking properties. Amongst these properties are some of the highest elastic moduli and tensile strengths ever observed in nature. The work, which was undertaken at Lancaster University's Physics department in conjunction with the University of Manchester and the National Physical Laboratory, offers a new approach to understanding the nanomechanical and nanoelectromechanical properties of 2D materials by utilising the nanoscale and nanosecond resolution of ultrasonic force and heterodyne force microscopy (UFM and HFM) - both contact mode atomic force microscopy (AFM) techniques. Using this approach and developing several other new techniques the authors succeeded in probing samples' subsurface and mechanical properties, which would otherwise remain hidden. Lastly, by using a new technique, coined electrostatic heterodyne force microscopy (E-HFM), the authors were able to observe nanoscale electromechanical vibrations with a nanometre and nanosecond resolution, in addition to probing the local electrostatic environment of devices fabricated from 2D materials.
  table of contents: Introduction -- Background -- Materials and Methods -- Morphology of 2D Materials and their Heterostructures -- Nanomechanical Phenomena -- Nanoelectromechanical Phenomena -- Further Work and Future Directions -- Conclusion.
  note: by Nicholas D. Kay.
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Interfaces (Physical sciences)
  subject:
    topic: Thin films
  subject:
    topic: Nanotechnology
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Nanoscale science
  subject:
    topic: Nanoscience
  subject:
    topic: Nanostructures
  subject:
    topic: Surface and Interface Science, Thin Films
  subject:
    topic: Nanotechnology
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Nanoscale Science and Technology
  classification: QC176.8.S8
  classification: QC611.6.S9
  classification: 530.417
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Springer Theses, Recognizing Outstanding Ph.D. Research
  identifier: 9783319701813
  identifier: https://doi.org/10.1007/978-3-319-70181-3
  record info:
    record creation date: 171127
    record change date: 20191029003257.0
    record identifier: 978-3-319-70181-3