rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Spectroscopic Ellipsometry for Photovoltaics
    sub title: Volume 2: Applications and Optical Data of Solar Cell Materials
  name:
    name part: Fujiwara, Hiroyuki.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: Collins, Robert W.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2018
    edition: 1st ed. 2018.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXI, 616 p. 330 illus., 204 illus. in color. online resource.
  abstract: Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features of advanced ellipsometry methods. This second volume of Spectroscopic Ellipsometry for Photovoltaics presents various applications of the ellipsometry technique for device analyses, including optical/recombination loss analyses, real-time control and on-line monitoring of solar cell structures, and large-area structural mapping. Furthermore, this book describes the optical constants of 148 solar cell component layers, covering a broad range of materials from semiconductor light absorbers (inorganic, organic and hybrid perovskite semiconductors) to transparent conductive oxides and metals. The tabulated and completely parameterized optical constants described in this book are the most current resource that is vital for device simulations and solar cell structural analyses.
  table of contents: Introduction -- Part I: Application of Ellipsometry Technique -- Analysis of Optical and Recombination Losses in Solar Cells -- Optical Simulation of External Quantum Efficiency Spectra -- Characterization of Textured Structures -- On-line Monitoring of Photovoltaics Production -- Real Time Measurement, Monitoring, and Control of CuIn1‑xGaxSe2 by Spectroscopic Ellipsometry -- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells -- Part II: Optical Data of Solar-Cell Component Materials -- Inorganic Semiconductors and Passivation Layers -- Organic Semiconductors -- Organic-Inorganic Hybrid Perovskites -- Transparent Conductive Oxides -- Metals -- Substrates and Coating Layers.
  note: edited by Hiroyuki Fujiwara, Robert W. Collins.
  subject:
    topic: Lasers
  subject:
    topic: Photonics
  subject:
    topic: Optical materials
  subject:
    topic: Electronic materials
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Renewable energy resources
  subject:
    topic: Microwaves
  subject:
    topic: Optical engineering
  subject:
    topic: Optics, Lasers, Photonics, Optical Devices
  subject:
    topic: Optical and Electronic Materials
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Renewable and Green Energy
  subject:
    topic: Microwaves, RF and Optical Engineering
  classification: TA1671-1707
  classification: TA1501-1820
  classification: 621.36
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Springer Series in Optical Sciences, 214
  identifier: 9783319951386
  identifier: https://doi.org/10.1007/978-3-319-95138-6
  record info:
    record creation date: 190110
    record change date: 20191022093055.0
    record identifier: 978-3-319-95138-6