rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Applied Scanning Probe Methods III
    sub title: Characterization
  name:
    name part: Bhushan, Bharat.
    role:
      role term: editor.
  name:
    name part: Fuchs, Harald.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2006
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XLIV, 378 p. 270 illus., 2 illus. in color. online resource.
  abstract: The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope, or AFM. The STM relies on electrons tunneling between tip and sample whereas the AFM depends on the force acting on the tip when it was placed near the sample. These were quickly followed by the - gneticForceMicroscope,MFM,and the Electrostatic Force Microscope, EFM. The MFM will image a single magnetic bit with features as small as 10nm. With the EFM one can monitor the charge of a single electron. Prof. Paul Hansma at Santa Barbara opened the door even wider when he was able to image biological objects in aqueous environments. At this point the sluice gates were opened and a multitude of different instruments appeared. There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM. The probe microscopes do not require preparation of the sample and they operate in ambient atmosphere, whereas, the SEM must operate in a vacuum environment and the sample must be cross-sectioned to expose the proper surface. However, the SEM can record 3D image and movies, features that are not available with the scanning probes.
  table of contents: Atomic Force Microscopy in Nanomedicine -- Scanning Probe Microscopy: From Living Cells to the Subatomic Range -- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces -- Probing Macromolecular Dynamics and the Influence of Finite Size Effects -- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum -- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures -- Scanning Probe Microscopy Applied to Ferroelectric Materials -- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy -- AFM Applications for Contact and Wear Simulation -- AFM Applications for Analysis of Fullerene-Like Nanoparticles -- Scanning Probe Methods in the Magnetic Tape Industry.
  note: edited by Bharat Bhushan, Harald Fuchs.
  subject:
    topic: Engineering
  subject:
    topic: Polymers
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Interfaces (Physical sciences)
  subject:
    topic: Thin films
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Engineering
  subject:
    topic: Nanotechnology and Microengineering
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Surface and Interface Science, Thin Films
  subject:
    topic: Nanotechnology
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Polymer Sciences
  classification: T174.7
  classification: 620.5
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: NanoScience and Technology
  identifier: 9783540269106
  identifier: http://dx.doi.org/10.1007/b138285
  record info:
    record creation date: 100301
    record change date: 20151204173926.0
    record identifier: 978-3-540-26910-6