rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Roadmap of Scanning Probe Microscopy
  name:
    name part: Morita, Seizo.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2007
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XVII, 201 p. online resource.
  abstract: Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surface science. Besides, atomic force microscopy is also rapidly developing and achieving remarkable progress and accomplishments such as true atomic resolution, atom/molecule identification, manipulation and nanostructuring. This book that predicts the future development for all of scanning probe microscopy (SPM). Such forecasts may help to determine the course ultimately to be taken and to accelerate research and development on nanotechnology and nanoscience, as well as all SPM-related fields in future.
  table of contents: Science and Technology in the Twenty-First Century -- Scanning Tunneling Microscopy -- Atomic Force Microscopy -- Near-Field Scanning Optical Microscope -- Scanning Capacitance Microscope -- Electrostatic Force Microscopy -- Magnetic Force Microscope -- STM-Induced Photon Emission Spectroscopy -- Scanning Atom Probe -- Chemical Discrimination of Atoms and Molecules -- Manipulation of Atoms and Molecules -- Multiprobe SPM -- AFM Measurement in Liquid -- High-Speed SPM -- Scanning Nonlinear Dielectric Microscope -- SPM Coupled with External Fields -- Probe Technology -- Characterization of Semiconducting Materials -- Evaluation of SPM for LSI Devices -- SPM Characterization of Catalysts -- SPM Characterization of Biomaterials -- SPM Characterization of Organic and Polymeric Materials -- Theories of SPM -- When Will SPM Realize Our Dreams? The Roadmap of SPM.
  note: edited by Seizo Morita.
  subject:
    topic: Materials science
  subject:
    topic: Condensed matter
  subject:
    topic: Engineering
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Materials Science
  subject:
    topic: Nanotechnology
  subject:
    topic: Condensed Matter Physics
  subject:
    topic: Engineering, general
  subject:
    topic: Surfaces and Interfaces, Thin Films
  classification: T174.7
  classification: TA418.9.N35
  classification: 620.115
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: NanoScience and Technology
  identifier: 9783540343158
  identifier: http://dx.doi.org/10.1007/978-3-540-34315-8
  record info:
    record creation date: 100301
    record change date: 20151204162948.0
    record identifier: 978-3-540-34315-8