rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Handbook of Practical X-Ray Fluorescence Analysis
  name:
    name part: Beckhoff, Burkhard.
    role:
      role term: editor.
  name:
    name part: Kanngießer, habil. Birgit.
    role:
      role term: editor.
  name:
    name part: Langhoff, Norbert.
    role:
      role term: editor.
  name:
    name part: Wedell, Reiner.
    role:
      role term: editor.
  name:
    name part: Wolff, Helmut.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2006
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXIV, 878 p. online resource.
  abstract: X-Ray Fluorescence analysis (XRF) is a reliable multi-elemental and nondestructive analytical method widely used in research and industrial applications. This practical handbook provides self-contained modules featuring XRF instrumentation, quantification methods, and most of the current applications. The broad spectrum of topics is due to the efforts of a large number of authors from a variety of different types of institutions such as universities, research institutes, and companies. The book gives a survey of the theoretical fundamentals, analytical instrumentation, software for data processing, various excitation regimes including gracing incidents and microfocus measurements, quantitative analysis, applications in routine and micro analysis, mineralogy, biology, medicine, criminal investigations, archeology, metallurgy, abrasion, microelectronics, environmental air and water analysis. It gives the basic knowledge on this technique, information on analytical equipment and guides the reader to the various applications. This practical handbook is intended as a resource for graduate students, research scientists, and industrial users.
  table of contents: X-ray tubes -- Radioisotopes -- Synchrotron radiation source -- Mirror optics -- Diffraction optics -- Optics for monochromators -- Focusing diffraction optics -- Refraction X-ray optics -- X-ray detectors and signal processing -- High resolution imaging X-ray CCD spectrometers -- Wavelength dispersive XRF and a comparison with EDS -- Quantitative analysis -- Specimen preparation -- Micro-X-ray fluorescence spectroscopy -- Micro XRF with synchrotron radiation -- TXRF wafer analysis -- Analysis of layers -- Environmental studies -- Geology, mining, metallurgy -- Arts and archaeology -- XRF-application in numismatics -- Analysis for forensic investigations -- X-Ray fluorescence analysis in the life sciences -- Non-invasive identification of chemical compounds by EDXRS -- X-ray safety and protection -- Useful data sources and links.
  note: edited by Burkhard Beckhoff, habil. Birgit Kanngießer, Norbert Langhoff, Reiner Wedell, Helmut Wolff.
  subject:
    topic: Chemistry
  subject:
    topic: Analytical chemistry
  subject:
    topic: Mass spectrometry
  subject:
    topic: Condensed matter
  subject:
    topic: Solid state physics
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Materials science
  subject:
    topic: Chemistry
  subject:
    topic: Analytical Chemistry
  subject:
    topic: Mass Spectrometry
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Solid State Physics
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Condensed Matter Physics
  classification: QD71-142
  classification: 543
  related item:
    title info:
      title: Springer eBooks
  identifier: 9783540367222
  identifier: http://dx.doi.org/10.1007/978-3-540-36722-2
  record info:
    record creation date: 100301
    record change date: 20151204165242.0
    record identifier: 978-3-540-36722-2