X-Ray Diffuse Scattering from Self-Organized Mesoscopic Semiconductor Structures

• Κύριος συγγραφέας: Schmidbauer, Martin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2004.
• Έκδοση: 1st ed. 2004.
• Σειρά: Springer Tracts in Modern Physics, 199
• Θέματα: Optics.; Electrodynamics.; Atoms.; Physics.; Optical materials.; Electronic materials.; Condensed matter.; Classical Electrodynamics.; Atomic, Molecular, Optical and Plasma Physics.; Optical and Electronic Materials.; Condensed Matter Physics.

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevanc...

Πίνακας περιεχομένων:

• A Brief Introduction to the Topic
• Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures
• Experimental Optimization
• A Model System: LPE SiGe/Si(001) Islands
• Dynamical Scattering at Grazing Incidence
• Characterization of Quantum Dots
• Characterization of Interface Roughness
• Appendix.