rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: UV-Visible Reflection Spectroscopy of Liquids
  name:
    name part: Räty, Jukka A.
    role:
      role term: creator
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: Peiponen, Kai-Erik.
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: Asakura, Toshimitsu.
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2004
    edition: 1st ed. 2004.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XII, 224 p. 17 illus., 5 illus. in color. online resource.
  abstract: This book presents an up-to-date overview of reflectometers used for optical spectroscopy of various kinds of liquids, ranging from well-known transparent liquids to "pathological" industrial liquids. The book reviews and explains basic materials for anyone wanting to get to know the theory, spectral analysis and modern devices needed for the measurement of refractive index and absorption of liquids. Moreover, the book gives an introduction to reflectivity from optically nonlinear liquids such as liquids containing nanoparticles. This latter topic is important in modern nano-sciences.
  table of contents: I Theory of Reflectometry -- 1 Demands on Measurement of Optical Constants of Liquids in Science and Industry -- 2 Liquids -- 3 Theory of Optical Constants -- 4 Theory of Reflectance -- 5 Probe Window Contamination and Reflectance -- 6 Wavelength Spectra Analysis -- II Practical Reflectometry -- 7 Introduction -- 8 Definitions of Optical Instrumentation and Measurement -- 9 Exploring the Insides of a Spectrophotometer -- 10 Understanding Your Signal -- 11 Before Measurement -- 12 From Theory to Measurement -- Appendices -- A Intensity Law for Nonlinear Absorption -- B Complex Angle of Refraction -- C Cauchy-Riemann Equations -- D Kramers-Kronig Integrals and Symmetry Properties -- References.
  note: by Jukka A. Räty, Kai-Erik Peiponen, Toshimitsu Asakura.
  subject:
    topic: Mass spectrometry
  subject:
    topic: Optics
  subject:
    topic: Electrodynamics
  subject:
    topic: Solid state physics
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Lasers
  subject:
    topic: Photonics
  subject:
    topic: Materials science
  subject:
    topic: Mass Spectrometry
  subject:
    topic: Classical Electrodynamics
  subject:
    topic: Solid State Physics
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Optics, Lasers, Photonics, Optical Devices
  subject:
    topic: Characterization and Evaluation of Materials
  classification: QD96.M3
  classification: 543.65
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Springer Series in Optical Sciences, 92
  identifier: 9783540450931
  identifier: https://doi.org/10.1007/978-3-540-45093-1
  record info:
    record creation date: 130321
    record change date: 20191027133323.0
    record identifier: 978-3-540-45093-1