rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: X-Ray Scattering from Soft-Matter Thin Films
    sub title: Materials Science and Basic Research
  name:
    name part: Tolan, Metin.
    role:
      role term: creator
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 1999
    edition: 1st ed. 1999.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: IX, 198 p. 28 illus. online resource.
  abstract: The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.
  table of contents: Reflectivity of x-rays from surfaces -- Reflectivity experiments -- Advanced analysis techniques -- Statistical description of interfaces -- Off-specular scattering -- X-ray scattering with coherent radiation -- Closing remarks.
  note: by Metin Tolan.
  subject:
    topic: Materials-Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Amorphous substances
  subject:
    topic: Complex fluids
  subject:
    topic: Solid state physics
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Soft and Granular Matter, Complex Fluids and Microfluidics
  subject:
    topic: Solid State Physics
  subject:
    topic: Spectroscopy and Microscopy
  classification: TA418.7-418.76
  classification: TA418.9.T45
  classification: 620.44
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Springer Tracts in Modern Physics, 148
  identifier: 9783540495253
  identifier: https://doi.org/10.1007/BFb0112834
  record info:
    record creation date: 100730
    record change date: 20191022181053.0
    record identifier: 978-3-540-49525-3