rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: High-Resolution X-Ray Scattering from Thin Films and Multilayers
  name:
    name part: Holy, Vaclav.
    role:
      role term: creator
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: Pietsch, Ullrich.
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: Baumbach, Tilo.
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 1999
    edition: 1st ed. 1999.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XI, 258 p. 140 illus. online resource.
  abstract: This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
  table of contents: Basic elements of the equipment -- Diffractometers and reflectometers -- Scans and resolution in angular and reciprocal space -- Basic principles -- Kinematical scattering theory -- Dynamical scattering theory -- Layer thicknesses of single layers and multilayers -- Lattice parameters and lattice strains in single expitaxial layers -- Volume defects in layers -- X-ray reflection by rough multilayers -- X-ray scattering by gratings and dots -- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal.
  note: by Vaclav Holy, Ullrich Pietsch, Tilo Baumbach.
  subject:
    topic: Lasers
  subject:
    topic: Photonics
  subject:
    topic: Materials-Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Crystallography
  subject:
    topic: Optics, Lasers, Photonics, Optical Devices
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Crystallography and Scattering Methods
  classification: TA1671-1707
  classification: TA1501-1820
  classification: 621.36
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Springer Tracts in Modern Physics, 149
  identifier: 9783540496250
  identifier: https://doi.org/10.1007/BFb0109385
  record info:
    record creation date: 121227
    record change date: 20191027192827.0
    record identifier: 978-3-540-49625-0