rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Transmission Electron Microscopy and Diffractometry of Materials
  name:
    name part: Fultz, Brent.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Howe, James M.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2008
    edition: Third Edition.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XX, 758 p. 440 illus. online resource.
  abstract: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials scientist or physicist who wants a good overview of current diffraction and imaging techniques.'' John Hutchison in Journal of Microscopy ``I can recommend it as a valuable resource for anyone involved in a higher-level course on materials characterization.'' Ray Egerton in Micron ``A wonderful book. A rare combination of depth, practical advice, and problems for every aspect of modern XRD, TEM, and EELS. No materials lab should be without it now that TEM/STEM has become such a crucial tool for nanoscience.'' John C. H. Spence, Arizona State University ``I give a lecture course here on Advanced Electron Microscopy and will certainly be recommending your book for my course. It is a superb book.’’ Colin Humphreys, Cambridge University ``This text offers the most complete pedagogical treatment of s…
  table of contents: Diffraction and the X-Ray Powder Diffractometer -- The TEM and its Optics -- Scattering -- Inelastic Electron Scattering and Spectroscopy -- Diffraction from Crystals -- Electron Diffraction and Crystallography -- Diffraction Contrast in TEM Images -- Diffraction Lineshapes -- Patterson Functions and Diffuse Scattering -- High-Resolution TEM Imaging -- High-Resolution STEM Imaging -- Dynamical Theory.
  note: by Brent Fultz, James M. Howe.
  subject:
    topic: Materials science
  subject:
    topic: Solid state physics
  subject:
    topic: Crystallography
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Engineering
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Crystallography
  subject:
    topic: Solid State Physics
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Engineering, general
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9783540738862
  identifier: http://dx.doi.org/10.1007/978-3-540-73886-2
  record info:
    record creation date: 100301
    record change date: 20151204153429.0
    record identifier: 978-3-540-73886-2