rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Applied Scanning Probe Methods VIII
    sub title: Scanning Probe Microscopy Techniques
  name:
    name part: Bhushan, Bharat.
    role:
      role term: editor.
  name:
    name part: Fuchs, Harald.
    role:
      role term: editor.
  name:
    name part: Tomitori, Masahiko.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: LIX, 465 p. online resource.
  abstract: The success of the Springer Series Applied Scanning Probe Methods I–VII and the rapidly expanding activities in scanning probe development and applications worldwide made it a natural step to collect further speci c results in the elds of development of scanning probe microscopy techniques (Vol. VIII), characterization (Vol. IX), and biomimetics and industrial applications (Vol. X). These three volumes complement the previous set of volumes under the subject topics and give insight into the recent work of leading specialists in their respective elds. Following the tradition of the series, the chapters are arranged around techniques, characterization and biomimetics and industrial applications. Volume VIII focuses on novel scanning probe techniques and the understanding of tip/sample interactions. Topics include near eld imaging, advanced AFM, s- cializedscanningprobemethodsinlifesciencesincludingnewselfsensingcantilever systems, combinations of AFM sensors and scanning electron and ion microscopes, calibration methods, frequency modulation AFM for application in liquids, Kelvin probe force microscopy, scanning capacitance microscopy, and the measurement of electrical transport properties at the nanometer scale. Vol. IX focuses on characterization of material surfaces including structural as well as local mechanical characterization, and molecular systems. The volume covers a broad spectrum of STM/AFM investigations including fullerene layers, force spectroscopy for probing material properties in general, biological lms .and cells, epithelial and endothelial layers, medical related systems such as amyloidal aggregates, phospholipid monolayers, inorganic lms on aluminium and copper - ides,tribological characterization, mechanical properties ofpolymernanostructures, technical polymers, and near eld optics.
  table of contents: Background-Free Apertureless Near-Field Optical Imaging -- Critical Dimension Atomic Force Microscopy for Sub-50-nm Microelectronics Technology Nodes -- Near Field Probes: From Optical Fibers to Optical Nanoantennas -- Carbon Nanotubes as SPM Tips: Mechanical Properties of Nanotube Tips and Imaging -- Scanning Probes for the Life Sciences -- Self-Sensing Cantilever Sensor for Bioscience -- AFM Sensors in Scanning Electron and Ion Microscopes: Tools for Nanomechanics, Nanoanalytics, and Nanofabrication -- Cantilever Spring-Constant Calibration in Atomic Force Microscopy -- Frequency Modulation Atomic Force Microscopy in Liquids -- Kelvin Probe Force Microscopy: Recent Advances and Applications -- Application of Scanning Capacitance Microscopy to Analysis at the Nanoscale -- Probing Electrical Transport Properties at the Nanoscale by Current-Sensing Atomic Force Microscopy.
  note: edited by Bharat Bhushan, Harald Fuchs, Masahiko Tomitori.
  subject:
    topic: Engineering
  subject:
    topic: Polymers
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Interfaces (Physical sciences)
  subject:
    topic: Thin films
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Engineering
  subject:
    topic: Nanotechnology and Microengineering
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Surface and Interface Science, Thin Films
  subject:
    topic: Nanotechnology
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Polymer Sciences
  classification: T174.7
  classification: 620.5
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Nano Science and Technolgy
  identifier: 9783540740803
  identifier: http://dx.doi.org/10.1007/978-3-540-74080-3
  record info:
    record creation date: 100301
    record change date: 20160816051536.0
    record identifier: 978-3-540-74080-3