rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Modern Developments in X-Ray and Neutron Optics
  name:
    name part: Erko, Alexei.
    role:
      role term: editor.
  name:
    name part: Idir, Mourad.
    role:
      role term: editor.
  name:
    name part: Krist, Thomas.
    role:
      role term: editor.
  name:
    name part: Michette, Alan G.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2008
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXIV, 534 p. 299 illus., 5 illus. in color. online resource.
  abstract: This volume describes modern developments in reflective, refractive and diffractive optics for short wavelength radiation as well as recent theoretical approaches to modelling and ray-tracing the X-ray and neutron optical systems. It is based on the joint research activities of specialists in X-ray and neutron optics from 11 countries, working together under the framework of the European Programme for Cooperation in Science and Technology (COST, Action P7) in the period 2002--2006. The chapters are written by leading specialists from European laboratories, universities and large facilities. In addition to new ideas and concepts, the contents provide a large amount of practical information about recently implemented devices and methods.
  table of contents: Theoretical Approaches and Calculations -- X-Ray and Neutron Optical Systems -- The BESSY Raytrace Program RAY -- Neutron Beam Phase Space Mapping -- Raytrace of Neutron Optical Systems with RESTRAX -- Wavefront Propagation -- Theoretical Analysis of X-Ray Waveguides -- Focusing Optics for Neutrons -- Volume Effects in Zone Plates -- Nano-Optics Metrology -- Slope Error and Surface Roughness -- The Long Trace Profilers -- The Nanometer Optical Component Measuring Machine -- Shape Optimization of High Performance X-Ray Optics -- Measurement of Groove Density of Diffraction Gratings -- The COST P7 Round Robin for Slope Measuring Profilers -- Hartmann and Shack–Hartmann Wavefront Sensors for Sub-nanometric Metrology -- Extraction of Multilayer Coating Parameters from X-Ray Reflectivity Data -- Refection/Refraction Optics -- Hard X-Ray Microoptics -- Capillary Optics for X-Rays -- Reflective Optical Arrays -- Reflective Optical Structures and Imaging Detector Systems -- CLESSIDRA: Focusing Hard X-Rays Efficiently with Small Prism Arrays -- Multilayer Optics Developments -- Neutron Supermirror Development -- Stress Reduction in Multilayers Used for X-Ray and Neutron Optics -- Multilayers with Ultra-Short Periods -- Specially Designed Multilayers -- Diffraction Optics -- Diffractive-Refractive Optics: X-ray Crystal Monochromators with Profiled Diffracting Surfaces -- Neutron Multiple Reflections Excited in Cylindrically Bent Perfect Crystals and Their Possible use for High-Resolution Neutron Scattering -- Volume Modulated Diffraction X-Ray Optics -- High Resolution 1D and 2D Crystal Optics Based on Asymmetric Diffractors -- Thermal Effects under Synchrotron Radiation Power Absorption.
  note: edited by Alexei Erko, Mourad Idir, Thomas Krist, Alan G. Michette.
  subject:
    topic: Physics
  subject:
    topic: Physical measurements
  subject:
    topic: Measurement
  subject:
    topic: Optics
  subject:
    topic: Optoelectronics
  subject:
    topic: Plasmons (Physics)
  subject:
    topic: Engineering
  subject:
    topic: Physics
  subject:
    topic: Optics, Optoelectronics, Plasmonics and Optical Devices
  subject:
    topic: Measurement Science and Instrumentation
  subject:
    topic: Engineering, general
  classification: QC350-467
  classification: TA1501-1820
  classification: QC392-449.5
  classification: TA1750-1750.22
  classification: 621.36
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Springer Series in optical science, 137
  identifier: 9783540745617
  identifier: http://dx.doi.org/10.1007/978-3-540-74561-7
  record info:
    record creation date: 100301
    record change date: 20151125211756.0
    record identifier: 978-3-540-74561-7