rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Optical Measurement of Surface Topography
  name:
    name part: Leach, Richard.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2011
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XIII, 323 p. online resource.
  abstract: The measurement and characterisation of surface topography is crucial to modern manufacturing industry. The control of areal surface structure allows a manufacturer to radically alter the functionality of a part. Examples include structuring to effect fluidics, optics, tribology, aerodynamics and biology. To control such manu­facturing methods requires measurement strategies. There is now a large range of new optical techniques on the market, or being developed in academia, that can measure areal surface topography. Each method has its strong points and limitations. The book starts with introductory chapters on optical instruments, their common language, generic features and limitations, and their calibration. Each type of modern optical instrument is described (in a common format) by an expert in the field. The book is intended for both industrial and academic scientists and engineers, and will be useful for undergraduate and postgraduate studies.
  table of contents: Introduction to surface texture measurement -- Some common terms and definitions -- Limitations of optical 3D sensors.- Calibration of optical surface topography measuring instruments.- Chromatic confocal microscopy -- Point autofocus instruments.- Focus variation instruments.- Phase shifting interferometry.- Coherence scanning interferometry -- Digital holographic microscopy.- Imaging confocal microscopy.- Light scattering methods.
  note: edited by Richard Leach.
  subject:
    topic: Materials science
  subject:
    topic: Physical measurements
  subject:
    topic: Measurement
  subject:
    topic: Microwaves
  subject:
    topic: Optical engineering
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Thin films
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Microwaves, RF and Optical Engineering
  subject:
    topic: Measurement Science and Instrumentation
  subject:
    topic: Surfaces and Interfaces, Thin Films
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9783642120121
  identifier: http://dx.doi.org/10.1007/978-3-642-12012-1
  record info:
    record creation date: 110330
    record change date: 20151204143609.0
    record identifier: 978-3-642-12012-1