rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Fabrication and Characterization in the Micro-Nano Range
    sub title: New Trends for Two and Three Dimensional Structures
  name:
    name part: Lasagni, Fernando A.
    role:
      role term: editor.
  name:
    name part: Lasagni, Andrés F.
    role:
      role term: editor.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2011
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: X, 222 p. online resource.
  abstract: This book shows an update in the field of micro/nano fabrications techniques of two and three dimensional structures as well as ultimate three dimensional characterization methods from the atom range to the micro scale. Several examples are presented showing their direct application in different technological fields such as microfluidics, photonics, biotechnology and aerospace engineering, between others. The effects of the microstructure and topography on the macroscopic properties of the studied materials are discussed, together with a detailed review of 3D imaging techniques.
  table of contents: Preface -- Exploring the possibilities of Laser Interference Patterning for the rapid fabrication of periodic arrays on macroscopic areas -- Laser Micromachining -- Patterning and optical properties of materials at the nanoscale -- Ion beam sputtering, a route for fabrication of highly ordered nanopatterns -- Three-dimensional Open Cell Structures:Evaluation and Fabrication by Additive Manufacturing -- X-ray Microtomography: characterisation of structures and defect analysis -- Submicron Tomography using high energy synchrotron radiation -- Nano characterization of structures by Focused Ion Beam (FIB) Tomography -- Atom probe tomography: 3D imaging at the atomic level.
  note: edited by Fernando A. Lasagni, Andrés F. Lasagni.
  subject:
    topic: Materials science
  subject:
    topic: Lasers
  subject:
    topic: Photonics
  subject:
    topic: Nanotechnology
  subject:
    topic: Materials Science
  subject:
    topic: Nanotechnology
  subject:
    topic: Nanotechnology and Microengineering
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Laser Technology, Photonics
  classification: T174.7
  classification: TA418.9.N35
  classification: 620.115
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Advanced Structured Materials, 10
  identifier: 9783642177828
  identifier: http://dx.doi.org/10.1007/978-3-642-17782-8
  record info:
    record creation date: 110323
    record change date: 20151103122512.0
    record identifier: 978-3-642-17782-8