rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Transmission Electron Microscopy and Diffractometry of Materials
  name:
    name part: Fultz, Brent.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Howe, James.
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: gw
    date issued: 2013
    edition: 4th ed. 2013.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XX, 764 p. online resource.
  abstract: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
  table of contents: Diffraction and X-Ray Powder Diffractometer Problems -- TEM and its Optics Problems -- Neutron Scattering Problems -- Scattering Problems -- Inelastic Electron Scattering and Spectroscopy Problems -- Diffraction from Crystals Sphere Problems -- Electron Diffraction and Crystallography Problems -- Diffraction Contrast in TEM Images Problems -- Diffraction Lineshapes Problems -- Patterson Functions and Diffuse Scattering Problems -- High-Resolution TEM Imaging Problems -- High-Resolution STEM and Related Imaging Techniques Problems -- Dynamical Theory Problems.
  note: by Brent Fultz, James Howe.
  subject:
    topic: Physics
  subject:
    topic: Spectroscopy
  subject:
    topic: Surfaces (Physics)
  subject:
    topic: Interfaces (Physical sciences)
  subject:
    topic: Thin films
  subject:
    topic: Microscopy
  subject:
    topic: Materials science
  subject:
    topic: Materials
    topic: Surfaces
  subject:
    topic: Physics
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Spectroscopy/Spectrometry
  subject:
    topic: Surfaces and Interfaces, Thin Films
  subject:
    topic: Surface and Interface Science, Thin Films
  classification: QC450-467
  classification: QC718.5.S6
  classification: 621.36
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: Graduate Texts in Physics
  identifier: 9783642297618
  identifier: http://dx.doi.org/10.1007/978-3-642-29761-8
  record info:
    record creation date: 121025
    record change date: 20151125022236.0
    record identifier: 978-3-642-29761-8