rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Electron Nano-Imaging
    sub title: Basics of Imaging and Diffraction for TEM and STEM
  name:
    name part: Tanaka, Nobuo.
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: ja
    date issued: 2017
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XXVIII, 333 p. 129 illus., 22 illus. in color. online resource.
  abstract: In the present book, the basics of imaging and diffraction in transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) are explained in textbook style. The book focuses on the explanation of electron microscopic imaging of TEM and STEM without including in the main text distracting information on basic knowledge of crystal diffraction, wave optics, mechanism of electron lens, and scattering/diffraction theories, which are explained in detail separately in the appendices. A comprehensive explanation is provided using Fourier transform theory. This approach is unique in comparison with other advanced textbooks on high-resolution electron microscopy. With the present textbook, readers are led to understand the essence of the imaging theories of TEM and STEM without being diverted by facts about electron microscopic imaging. The up-to-date information in this book, particularly for imaging details of STEM and aberration corrections, is valuable worldwide for today’s graduate students and professionals just starting their careers.
  table of contents: Seeing nanometer-sized world -- Structure and imaging of a transmission electron microscope (TEM) -- Basic theories of TEM imaging -- Resolution and image contrast of a transmission electron microscope (TEM) -- What is high-resolution transmission electron microscopy ? -- Lattice images and structure images -- Imaging theory of high-resolution TEM and image simulation -- Advanced transmission electron microscopy -- What is scanning transmission electron microscopy (STEM)? -- Imaging of scanning transmission electron microscopy (STEM) -- Image contrast and its formation mechanism in STEM -- Imaging theory for STEM -- Future prospects and possibility of TEM and STEM -- Concluding remarks -- Introduction of Fourier transforms for TEM and STEM -- Imaging by using a convex lens: Convex lens as phase shifter -- Contrast transfer function of a transmission electron microscope: Key term for understanding of phase contrast in HRTEM -- Complex-valued expression of aberrations of a round lens -- Cowley's theory for TEM and STEM imaging -- Introduction to the imaging theory for TEM including non-linear terms -- What are image processing methods? -- Elemental analysis by electron microscopes: Analysis using an electron probe -- Electron beam damage to specimens -- Scattering of electrons by an atom: Fundamental process for visualization of a single atom by TEM -- Electron diffraction and convergent beam electron diffraction (CBED): Basis for formation of lattice fringes in TEM and image intensity of STEM -- Bethe's method for dynamical electron diffraction: Basic theory of electron diffraction in thicker crystals -- Column approximation and Howie-Whelan's method for dynamical electron diffraction: Theory for observation of lattice defects -- Van-Dyck's method for dynamical electron diffraction and imaging: Basis of atomic column imaging -- Eikonal theory for scattering of electrons by a potential -- Debye-Waller factor and thermal diffuse scattering (TDS) -- Relativistic effects…
  note: by Nobuo Tanaka.
  subject:
    topic: Materials science
  subject:
    topic: Spectroscopy
  subject:
    topic: Nanoscale science
  subject:
    topic: Nanoscience
  subject:
    topic: Nanostructures
  subject:
    topic: Microscopy
  subject:
    topic: Materials Science
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Spectroscopy/Spectrometry
  subject:
    topic: Nanoscale Science and Technology
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  identifier: 9784431565024
  identifier: http://dx.doi.org/10.1007/978-4-431-56502-4
  record info:
    record creation date: 170404
    record change date: 20170404114451.0
    record identifier: 978-4-431-56502-4