http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Field Emission Scanning Electron Microscopy
New Perspectives for Materials Characterization
XII, 137 p. 53 illus., 20 illus. in color. online resource.
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
Characterization and Evaluation of Materials
SpringerBriefs in Applied Sciences and Technology