rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Field Emission Scanning Electron Microscopy
    sub title: New Perspectives for Materials Characterization
  name:
    name part: Brodusch, Nicolas.
    role:
      role term: creator
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: Demers, Hendrix.
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: Gauvin, Raynald.
    role:
      role term: author.
    role:
      role term: aut
    role:
      role term: http://id.loc.gov/vocabulary/relators/aut
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  origin info:
    place:
      place term: si
    date issued: 2018
    edition: 1st ed. 2018.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: electronic resource
    reformatting quality: access
    form: remote
    extent: XII, 137 p. 53 illus., 20 illus. in color. online resource.
  abstract: This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
  note: by Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
  subject:
    topic: Materials science
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Nanotechnology
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Nanotechnology and Microengineering
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer eBooks
  related item:
    title info:
      title: SpringerBriefs in Applied Sciences and Technology
  identifier: 9789811044335
  identifier: https://doi.org/10.1007/978-981-10-4433-5
  record info:
    record creation date: 170927
    record change date: 20191027072024.0
    record identifier: 978-981-10-4433-5