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Glatzel, Thilo
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Kelvin Probe Force Microscopy From Single Charge Detection to Device Characterization /
Published 2018
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Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces /
Published 2012
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Related Subjects
Materials science
Surfaces and Interfaces, Thin Films
Thin films
Characterization and Evaluation of Materials
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Measurement Science and Instrumentation
Measurement
Microscopy
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Nanotechnology and Microengineering
Physical measurements
Spectroscopy
Spectroscopy and Microscopy
Surfaces
Thermodynamics
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