Bourgoin, J., & Lannoo, M. (1983). Point defects in semiconductors II: Experimental aspects. Springer - Verlag.
Chicago Style (17th ed.) CitationBourgoin, Jacques, and M. Lannoo. Point Defects in Semiconductors II: Experimental Aspects. Berlin Heidelberg: Springer - Verlag, 1983.
MLA (8th ed.) CitationBourgoin, Jacques, and M. Lannoo. Point Defects in Semiconductors II: Experimental Aspects. Springer - Verlag, 1983.
Warning: These citations may not always be 100% accurate.