Manufacturing yield evaluation of VLSI/WSI systems

Bibliographic Details
Main Author: Ciciani, Bruno
Format: Book
Language:English
Published: Los Alamitos, California IEEE Computer Society Press 1995
Subjects:

ΒΚΠ - Πατρα: BSC

Holdings details from ΒΚΠ - Πατρα: BSC
Call Number: 621.395 C
Copy 1 Available