Semiconductor interfaces at the sub-nanometer scale /

Bibliographic Details
Corporate Author: NATO Advanced Research Workshop on the Physical Properties of Semiconductor Interfaces at the Subnanometer Scale Riva del Garda, Italy
Other Authors: Salemink, H. W. M (επιμελητής.), Pashley, M. D (επιμελητής.)
Format: Conference Proceeding Book
Language:English
Published: Dordrecht : Kluwer Academic Publishers, 1993.
Series:NATO ASI series Applied sciences 243.
Subjects:

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