Structural and chemical analysis of materials X-ray, electron and neutron diffraction, X-ray, electron and ion spectrometry, electron microscopy

• Main Author: Eberhart, Jean Pierre
• Format: Book
• Language: English; French
• Published: Chichester John Wiley & Sons 1991
• Subjects: Επιστήμη των υλικών; Φυσική της στερεάς κατάστασης
• Physical Description: xxx, 545 p. fig., tab. 24 cm.
• Bibliography: Includes appendix, references and index
• ISBN: 0471950149