Statistical methods for reliability data /

Bibliographic Details
Main Author: Meeker, William Q. (συγγραφέας)
Other Authors: Escobar, Luis A. (συγγραφέας)
Format: Book
Language:English
Published: New York : Wiley, c1998.
Series:Wiley series in probability and statistics. Applied probability and statistics.
Subjects:

ΒΚΠ - Αγρίνιο: BSC

Holdings details from ΒΚΠ - Αγρίνιο: BSC
Call Number: 620.004 52 ΜΕΕ
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