Applied logistic regression /

• Main Author: Hosmer, David W. (συγγραφέας.)
• Other Authors: Lemeshow, Stanley (συγγραφέας.)
• Format: eBook
• Language: English
• Published: New York : Wiley, c2000.
• Edition: 2η έκδ.
• Series: Wiley series in probability and statistics Texts and references section
• Subjects: Ανάλυση παλινδρόμησης; Εξόρυξη δεδομένων; Στατιστικά μοντέλα; Ηλεκτρονικά βιβλία

In this revised and updated edition, the authors continue to provide an accessible introduction to the logistic regression model while incorporating advances of the last decade, including a variety of software packages for the analysis of data sets. They extend the discussion from biostatistics and...