Electron microscopy and analysis 1999 : proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference, University of Sheffield, 24-27 August 1999 /

• Συγγραφή απο Οργανισμό/Αρχή: Institute of Physics (Great Britain). Electron Microscopy and Analysis Group
• Άλλοι συγγραφείς: Kiely, C. J.
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Bristol ; Philadelphia : Institute of Physics Pub., �1999.
• Σειρά: Institute of Physics conference series ; no. 161.
• Θέματα: Electron microscopy > Congresses.; SCIENCE > Electron Microscopes & Microscopy.; Electron microscopy.; Electronic books.; Conference papers and proceedings.

Πίνακας περιεχομένων:

• Section 1 Plenary lectures
• Section 2 Interfaces and surfaces
• Section 3 Scanning electron microscopy
• Section 4 Electron crystallography
• Section 5 Analytical electron microscopy
• Section 6 High resolution electron microscopy
• Section 7 Advanced scanning probe techniques
• Section 8 Ceramics/carbon/composites
• Section 9 Metals/intermetallics
• Section 10 Catalysts/sensors/environmental materials
• Section 11 Semiconductors/superconductors.