Basic surfaces and their analysis /

• Κύριος συγγραφέας: Goncharova, Lyudmila V. (συγγραφέας.)
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: San Rafael [Καλιφόρνια] : Morgan & Claypool Publishers, c2018.
• Σειρά: IOP concise physics.
• Θέματα: Επιφάνειες (Φυσική)

This book is an introduction to the basics of surface science. The Nobel Prize winner Wolfgang Pauli's statement, 'God made solids, but surfaces were the work of the devil!' emphasizes the diabolic nature of surfaces. Surfaces are the external border of materials to the external world...

Πίνακας περιεχομένων:

• 1. Introduction
• 1.1. Why are surfaces important?
• 1.2. Ultra-high vacuum science and technology
• 1.3. Exercises
• 2. Thermodynamics of surfaces : equilibrium crystal shape
• 2.1. Surface thermodynamic functions
• 2.2. Surface tension and specific surface energy
• 2.3. Thermodynamics of surfaces
• 2.4. Curved interfaces and contact angle
• 2.5. Anisotropy of surface free energy
• 2.6. Equilibrium crystal shape
• 2.7. Summary and challenges
• 2.8. Exercises
• 3. Surface structure in real and reciprocal space
• 3.1. Bulk truncation structures
• 3.2. Relaxations and reconstructions
• 3.3. Classifications of two-dimensional periodic structures
• 3.4. Wood's and matrix notation for two-dimensional substrate and overlayer structures
• 3.5. Real and reciprocal space lattices
• 3.6. Summary
• 3.7. Exercises
• 4. Experimental probes and techniques (overview)
• 5. Electron spectroscopies and microscopies
• 5.1. Electron backscattering and diffraction
• 5.2. Low-energy electron diffraction (LEED)
• 5.3. Applications and complications of LEED
• 5.4. Thermal energy atom diffraction
• 5.5. Reflection high-energy electron diffraction (RHEED)
• 5.6. Low-energy electron microscopy (LEEM)
• 5.7. Scanning electron microscopy (SEM)
• 5.8. Exercises
• 6. Photoelectron spectroscopies
• 6.1. Photoemission spectroscopy principles
• 6.2. Data interpretation : notations, work function, chemical shifts
• 6.3. Instrumentation
• 6.4. Auger electron spectroscopy and microscopy
• 6.5. Quantitative analysis
• 6.6. Exercises
• 7. Ion scattering and high-resolution ion depth profiling methods
• 7.1. Ion-solid interactions
• 7.2. Stopping and range of ions in matter (SRIM)
• 7.3. Sputtering
• 7.4. Rutherford backscattering spectrometry and elastic recoil detection
• 7.5. Secondary ion mass spectrometry (SIMS)
• 7.6. Low- and medium-energy ion scattering
• 7.7. Exercises.