Quantum metrology with photoelectrons. Volume 2, Applications and advances /

• Κύριος συγγραφέας: Hockett, Paul (συγγραφέας.)
• Μορφή: Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: San Rafael [Καλιφόρνια] : Morgan & Claypool Publishers, c2018.
• Σειρά: IOP concise physics.
• Θέματα: Μετρολογία; Θεωρία κβαντικής μέτρησης
• Φυσική περιγραφή: 1 ηλεκτρονική πηγή (ποικίλες σελιδαριθμήσεις) : έγχρ. εικ..
• Βιβλιογραφία: Περιλαμβάνει βιβλιογραφικές παραπομπές.
• ISBN: 9781681746883; 9781681746906
• ISSN: 2053-2571

Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and advances discusses the fundamental concepts along with recent and emerging applications. Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on 'complete' photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.